Oakland Introduces Multilayer Thickness Measurement Systems and Microscopes for Coex Film Analysis

Oakland Instrument is pleased to introduce the LayerGaugeTM range of benchtop multi-layer film thickness gauges and analysis software by Davinor.

Designed for precise measurement of individual layer thickness in coextruded films and coated materials with unsurpassed accuracy and resolution.  Oakland also offers a complete line of accessories for your LayerGaugeTM, including microscope systems, layer measurement software, and sample preparation accessories to meet todays' demanding quality control requirements for barrier and complex film structures.

Available in three models, the Model 16, the Model 22, and the Model 32, each with a unique range of automatic and manual features.

The Model 32 LayerGauge (shown upper left) provides full automatic profiling capabilities, and includes unwind & rewind rollers for convenient sample handling plus speed & tension adjustability of the sample rollers to ensure optimum sample transport.  Adjustable-height guide rollers on either side of the sensor area ensure that the sample is correctly positioned for measurement.

The Model 22 LayerGauge also provides full automatic profiling capabilities, and includes fixed infeed tension using a weighted disk to ensure optimum sample transport.  Fixed position guide rollers on either side of the sensor area ensure that the sample is correctly positioned for measurement.

The Model 16 LayerGauge also provides profiling capabilities by hand-feeding the sample across the sensor area to pre-defined distances between sample points.  Or, the Model 16 provides quick spot checks of individual areas of concern  Safe, and easy to use, the Model 16 is a cost-effective addition for your film manufacturing process.

The industry-leading M-Flex Software combined with the LayerGauge measurement console provides a user-friendly environment to capture layer thickness information with unparalleled resolution and accuracy.

Automatic filtering provides positive identification of layer thickness data.

Automatically displays multi-layer profiles for use in process adjustments, scheduling equipment maintenance, and improvements to your coextrusion or coating process.

M-Flex Sofware provides thickness determinations, measuring tolerances, analysis, and a full range of reports.

"Savings through Knowledge" allows you to improve quality and reduce costs, simultaneously.

Let Oakland Instrument provide a free, no obligation, sample analysis for you.  Just send in your sample.

Model LG-9152 Layer Analysis Microscope System for Coex Films

Oakland Instrument is pleased to introduce Microscope-based Coex Film Analysis systems for blown films, cast films, coatings and laminates.

The LG-9152 Microscope System can be provided in two system formats:

With the LG-D20B Video Microscope Camera and LG-100K Video Measurement Micrometer with LCD Display for analog display and measurement of layer thickness, perfect for QC / Plant Floor applications, or

With the LG-2100 Digital Microscope Camera and LG-2100-IA Analysis Software for digital computerized display, measurement, and image capture of layer thickness, ideal for R&D / Lab applications.

Packaged to include microscope, lighting system, magnification components, cameras, and analysis software or video systems for a complete solution to your film layer analysis needs.

Sample Mounting Fixtures for Coex Film Layer Analysis

Oakland Instrument is pleased to introduce Microscope-based Coex Film Analysis systems and Accessories for blown films, cast films, coatings and laminates.

Specialized Sample Mounting Fixtures are available to meet your exacting requirements.